High acceleration test chamber

Introduction to High Acceleration Test Chamber:

The purpose of this product is:

1. This test chamber is suitable for the life test research of electrical and electronic products and their electronic components, printed circuit board components, etc., by applying methods including high temperature step, low temperature step

Rapid temperature change cycles, six degree of freedom non Gaussian broadband random vibrations, and other single or comprehensive stresses, gradually increasing the stress on these test samples to determine their

The stress limit that can be tolerated enables rapid identification and improvement of product defects during research and development, design, trial production, and batch production stages, shortening research and development time while ensuring production

Simultaneously achieving the goal of rapid market launch while ensuring product quality;

2. This test chamber can also be used for high acceleration stress screening of electrical and electronic products and their electronic components, printed circuit board components, etc. The results obtained through high acceleration life testing show that

After determining the working limit and failure limit of the product, the corresponding accelerated stress is applied to the product during the trial production or mass production stage, and the product is screened

In order to effectively monitor the consistency of product manufacturing processes, eliminate defective products, and reduce product repair rates! For large-scale electrical and electronic products, it is recommended to

Perform high acceleration life testing or high acceleration stress screening testing on the assembly level of the front-end (such as printed circuit board components, submodules).

Product prohibition:

◆ Testing and storage of flammable, explosive, and volatile substance samples

Testing and storage of corrosive substance samples

◆ Testing or storage of biological samples

Testing and storage of strong electromagnetic emission source samples